Burn in test

Production Solutions Aehr Test Systems provides complete production solutions across your product manufacturing flow to improve yield and reliability. Wafer Level Test and Burn-in Solutions Single Wafer Test and Burn-in SolutionsThe FOX-CP is a single wafer, single touchdown burn-in and test solution for high volume production.Lowest test cost per wafer, as more tests move from packaged parts to wafers for stacked die applicationsIndustry first Universal Channel Architecture where any channel supports I/O, Power Supply, Clock, PPMU functionality – thousands of resources available for full-wafer testing Optimized for DFT, BIST, and high parallelismProven applications include: Full wafer functional, stress, and burn-in test of automotive ICs; low cost full wafer test of discrete or embedded memories;Learn more about Single Wafer Test and Burn-in Solutions. Multi Wafer Test and Burn-in SolutionsThe FOX-XP is a Multi-Wafer System burn-in and test solution for high volume productionLowest test & burn-in cost per wafer for complex devices – test up to 18 wafers in parallel in a single chamberUses Aehr Test WaferPakTM Contactors with tens of thousands of pins to contact each wafer for single insertion full-wafer test and burn-inIndustry first Universal Channel Architecture where any channel supports I/O, Power Supply, Clock, PPMU functionalityOptimized for DFT, BIST, and Long Test TimesProven applications include: Full wafer functional test, stress, cycling and burn-in of Logic, Memory and Photonic devicesStand alone and full-automation test cells with integrated WaferPak Handler/AlignersLearn more about Multi Wafer Test and Burn-in Solutions. Die Level Test and Burn-in Solutions The FOX-XP is a highly flexible test/burn-in solution for singulated die and module testing through use of FOX DiePak carriers. An optional automated DiePak Loader is available for loading/unloading devices into DiePak Carriers to increase throughput.Accommodate 100s of modules/dice per burn-in/test boardAddress very small die / CSP module pad contact requirementsSolve module/die socketing challengesMeasure optical light energy of individual dice/modulesMaintain tight thermal control of heat generated by device and optical light energyLearn more about Die Level Test and Burn-in Solutions. Packaged Parts Test and Burn-in Solutions The Sonoma and Tahoe Systems are the industry’s most capable test and burn-in platforms for today’s advanced semiconductor devicesModular, upgradeable, and scalable test electronics for future-proof capabilitiesHigh power option up to 2000W per DUTSupports production burn-in screening, and HTOL, HTRB, HTGB qualification testingCutting-edge pin electronics for test versatilityProtocol-aware testing with SPI, I2C, PSI5 communicationsDUT-level voltage, current, or temperature monitoringGUI-based test programming and enterprise-level database management and automationLearn more about Packaged Parts Test and Burn-in Solutions. System Level Test and Burn-in Solutions System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test

The TS-H552B also writes to DVD+Rs at 16X, to 12X DVD-Rs at 16X, and DVD+/-RWs at 4X. It reads all DVDs at 16X.The TS-H552B's speed ratings matched its performance scores in CNET Labs' benchmarks. It took the drive about 16 minutes longer than the Pioneer DVR-A08XL to burn a DL disc. But the Samsung earned the second-fastest DL rip time we've seen, though its score was still 5 minutes behind the Pioneer's. The TS-H552B did a particularly good job ripping and burning audio CDs, earning the second-fastest scores in both tasks among the drives we've tested. It also took the third spot in single-layer DVD ripping and burning. Also, the drive managed to read DVD+/-RWs about as fast as most other drives. Out of the five drives and the five players we loaded our test disc into, only one of the players failed to read the disc.While the TS-H552B ships with the same one-year warranty as most DL drives, its toll-free tech-support number is a cut above the toll-based numbers offered by the majority of competitors. Phone support is available for the life of the drive, though only Monday through Friday from 8 a.m. to 8 p.m. ET. Don't waste your time with the Samsung support Web site unless you need an electronic copy of the manual, which is sadly the only useful piece of information on the TS-H552B that the site contains.DVD movie rip/burn tests (min:sec) (Shorter bars indicate better performance) 4.4GB DVD Video burn test 4.4GB DVD Video rip test (from DVD Video) Memorex 16X16X (16X DVD-R)06:23 Memorex 16X16X (16X DVD+R)06:23 15:59 * The Samsung drive writes to 12X DVD-R media at 16X. Double-layer DVD movie rip/burn tests (min:sec) (Shorter bars indicate better performance) 7.9GB DVD Video burn test 7.9GB DVD Video rip test (from DVD Video) Memorex 16X16X (4X double-layer DVD+R)**26:01 30:46 * The Plextor drive writes to 2.4X double-layer DVD+R media at 6X.** The Memorex, NEC, and Sony write to 2.4X double-layer DVD+R media at 4X. CD Audio rip/burn tests (min:sec) (Shorter bars indicate better performance) 74:35 CD Audio burn test 74:35 CD Audio rip test Memorex 16X16X (48X CD-R)02:53 06:27 RW read/write tests (min:sec) (Shorter bars indicate better performance) 4.22GB RW write test 4.22GB RW read test Memorex 16X16X (8X DVD+RW)07:14 09:49 Memorex 16X16X (6X DVD-RW)10:12 09:50

Test - Read/Write test the device without erasing data H6 only examines empty area of the device, thus data will not be erased. It tests in the same way as H2, which skips testing data area. Burn-in test: the favorite exam function for professional IC manufacturers and USB drive manufacturers U-Reach burn-in solution is the best choice for industries that need life-time testing, and flexible test settings. Testing time is adjustable from 30 min to 30 days. Able to set round time of test Able to set the range of testing on device Able to set the method of writing U-Reach Burn-in solution satisfies all kinds of test needs. In the past, users had to prepare more than 10 PCs and incur huge labor cost on maintenance for Burn-in test. Let’s forget about the past, because the U-Reach 1-119 targets duplicator has the capability to test 119 devices AT ONE TIME! U-Reach 1-119 target duplicator applies Multi-Core Transfer Technology, and has 30 times better efficiency than a PC. Capacity Check (test completes in an instant) The quality of flash memory on the market varies greatly. Thanks to the unique technology of U-Reach, you are able to sort out any device that has FAKE capacity. ​ This function is only to find out the capacity error made by MP tool. Because there are numerous capacity FAKING technology in the market, Capacity Check does not detect ALL fake cards. It is recommended to use H5 quality test to ensure bad sector /fake cards are completely out of your worry. A2 Advanced A2 fake picker This advanced tool is used to sort out fake cards utilizing more secure and more advanced technology. ​ This function is only to find out the capacity error made my MP tool. Because there are numerous capacity FAKING technology in the market, Capacity Check does not detect ALL fake cards. It is recommended to use H5 quality test to ensure bad sector/ fake cards are completely out of your worry. Speed Check Speed Check tests reading/writing speed of device with ONLY 8 seconds. It is the best tool